Researchers at the University of Tokyo in Japan have succeeded in measuring the electrical conductance at specific sites on a single-atom point contact for the first time. The contact was formed between the lead tip of a scanning tunnelling microscope (STM) and a lead sample surface. The technique could help us better understand the physical properties of metals and superconductors and so make better nanoscale devices in the future……
http://nanotechweb.org/cws/article/tech/61378
