Researchers in the US, Germany, Singapore and Spain have developed a new technique to image grain boundary defects in graphene by analysing how surface plasmons are reflected and scattered by the defects. The study reveals that the boundaries, which act as electronic barriers around 10–20 nm in size, are responsible for the low electron mobility observed in graphene grown by chemical vapour deposition. These barriers might be used as tuneable “plasmon reflectors” and “phase retarders” in plasmonic circuits made of graphene in the future…..
http://nanotechweb.org/cws/article/tech/55051