{"id":2979,"date":"2011-08-18T10:51:25","date_gmt":"2011-08-18T03:51:25","guid":{"rendered":"https:\/\/nano2.toolsmkt.com\/?p=2979"},"modified":"2011-08-18T10:51:25","modified_gmt":"2011-08-18T03:51:25","slug":"nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics","status":"publish","type":"post","link":"https:\/\/nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/","title":{"rendered":"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics"},"content":{"rendered":"<p>While carbon nanotubes offer great promise, especially since they can theoretically carry 1,000 times more electric current than a metal conductor of the same size, new research conducted by the United States National Institute of Standards and Technology (NIST) suggests <!--more-->that device reliability is a major issue. NIST researchers fabricated and tested numerous nanotube interconnects between metal electrodes and found that the metal electrodes fail when currents rise above a certain threshold. Moreover, the nanotubes can sustain extremely high current densities for several hours, but then slowly degrade under constant current. The NIST work offers an early look at how these materials may behave in real electronic devices over the long term. Mark Strus, a NIST postdoctoral researcher, said, &#8220;The common link is that we really need to study the interfaces,&#8221; such as the intersections between the nanotubes and metals and between different nanotubes. Strus adds that despite the reliability concerns, the carbon nanotube networks may ultimately be useful for some electronic applications: &#8220;For instance, carbon nanotube networks may not be the replacement for copper in logic or memory devices, but they may turn out to be interconnects for flexible electronic displays or photovoltaics.&#8221;<\/p>\n<p>http:\/\/www.nist.gov\/mml\/materials_reliability\/cnt-081611.cfm<\/p>\n","protected":false},"excerpt":{"rendered":"<p>While carbon nanotubes offer great promise, especially since they can theoretically carry 1,000 times more electric current than a metal [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"default","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":""},"categories":[34],"tags":[],"class_list":["post-2979","post","type-post","status-publish","format-standard","hentry","category-technology-update"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.5 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics - National Nanotechnology Center<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics - National Nanotechnology Center\" \/>\n<meta property=\"og:description\" content=\"While carbon nanotubes offer great promise, especially since they can theoretically carry 1,000 times more electric current than a metal [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/\" \/>\n<meta property=\"og:site_name\" content=\"National Nanotechnology Center\" \/>\n<meta property=\"article:published_time\" content=\"2011-08-18T03:51:25+00:00\" \/>\n<meta name=\"author\" content=\"Author user\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Author user\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/\"},\"author\":{\"name\":\"Author user\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#\\\/schema\\\/person\\\/54985d672de7577f5123522535b02e1e\"},\"headline\":\"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics\",\"datePublished\":\"2011-08-18T03:51:25+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/\"},\"wordCount\":212,\"publisher\":{\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#organization\"},\"articleSection\":[\"Technology Update\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/\",\"url\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/\",\"name\":\"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics - National Nanotechnology Center\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#website\"},\"datePublished\":\"2011-08-18T03:51:25+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#website\",\"url\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/\",\"name\":\"National Nanotechnology Center\",\"description\":\"NANOTEC\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#organization\",\"name\":\"National Nanotechnology Center\",\"url\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/nanotec.or.th\\\/en\\\/wp-content\\\/uploads\\\/2025\\\/08\\\/Nanotec-2-logo.png\",\"contentUrl\":\"https:\\\/\\\/nanotec.or.th\\\/en\\\/wp-content\\\/uploads\\\/2025\\\/08\\\/Nanotec-2-logo.png\",\"width\":1332,\"height\":391,\"caption\":\"National Nanotechnology Center\"},\"image\":{\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.nanotec.or.th\\\/en\\\/#\\\/schema\\\/person\\\/54985d672de7577f5123522535b02e1e\",\"name\":\"Author user\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/f49d9160cb81f15d70c8049f3079047f5480a64c3a547344af5b52101068fc3b?s=96&d=mm&r=g\",\"url\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/f49d9160cb81f15d70c8049f3079047f5480a64c3a547344af5b52101068fc3b?s=96&d=mm&r=g\",\"contentUrl\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/f49d9160cb81f15d70c8049f3079047f5480a64c3a547344af5b52101068fc3b?s=96&d=mm&r=g\",\"caption\":\"Author user\"},\"sameAs\":[\"https:\\\/\\\/www.nanotec.or.th\\\/en\"],\"url\":\"https:\\\/\\\/nanotec.or.th\\\/en\\\/author\\\/thaispo\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics - National Nanotechnology Center","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/","og_locale":"en_US","og_type":"article","og_title":"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics - National Nanotechnology Center","og_description":"While carbon nanotubes offer great promise, especially since they can theoretically carry 1,000 times more electric current than a metal [&hellip;]","og_url":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/","og_site_name":"National Nanotechnology Center","article_published_time":"2011-08-18T03:51:25+00:00","author":"Author user","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Author user","Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/#article","isPartOf":{"@id":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/"},"author":{"name":"Author user","@id":"https:\/\/www.nanotec.or.th\/en\/#\/schema\/person\/54985d672de7577f5123522535b02e1e"},"headline":"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics","datePublished":"2011-08-18T03:51:25+00:00","mainEntityOfPage":{"@id":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/"},"wordCount":212,"publisher":{"@id":"https:\/\/www.nanotec.or.th\/en\/#organization"},"articleSection":["Technology Update"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/","url":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/","name":"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics - National Nanotechnology Center","isPartOf":{"@id":"https:\/\/www.nanotec.or.th\/en\/#website"},"datePublished":"2011-08-18T03:51:25+00:00","breadcrumb":{"@id":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.nanotec.or.th\/en\/nist-uncovers-reliability-issues-for-carbon-nanotubes-in-future-electronics\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.nanotec.or.th\/en\/"},{"@type":"ListItem","position":2,"name":"NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics"}]},{"@type":"WebSite","@id":"https:\/\/www.nanotec.or.th\/en\/#website","url":"https:\/\/www.nanotec.or.th\/en\/","name":"National Nanotechnology Center","description":"NANOTEC","publisher":{"@id":"https:\/\/www.nanotec.or.th\/en\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.nanotec.or.th\/en\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.nanotec.or.th\/en\/#organization","name":"National Nanotechnology Center","url":"https:\/\/www.nanotec.or.th\/en\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.nanotec.or.th\/en\/#\/schema\/logo\/image\/","url":"https:\/\/nanotec.or.th\/en\/wp-content\/uploads\/2025\/08\/Nanotec-2-logo.png","contentUrl":"https:\/\/nanotec.or.th\/en\/wp-content\/uploads\/2025\/08\/Nanotec-2-logo.png","width":1332,"height":391,"caption":"National Nanotechnology Center"},"image":{"@id":"https:\/\/www.nanotec.or.th\/en\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.nanotec.or.th\/en\/#\/schema\/person\/54985d672de7577f5123522535b02e1e","name":"Author user","image":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/secure.gravatar.com\/avatar\/f49d9160cb81f15d70c8049f3079047f5480a64c3a547344af5b52101068fc3b?s=96&d=mm&r=g","url":"https:\/\/secure.gravatar.com\/avatar\/f49d9160cb81f15d70c8049f3079047f5480a64c3a547344af5b52101068fc3b?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/f49d9160cb81f15d70c8049f3079047f5480a64c3a547344af5b52101068fc3b?s=96&d=mm&r=g","caption":"Author user"},"sameAs":["https:\/\/www.nanotec.or.th\/en"],"url":"https:\/\/nanotec.or.th\/en\/author\/thaispo\/"}]}},"_links":{"self":[{"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/posts\/2979","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/comments?post=2979"}],"version-history":[{"count":0,"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/posts\/2979\/revisions"}],"wp:attachment":[{"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/media?parent=2979"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/categories?post=2979"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/nanotec.or.th\/en\/wp-json\/wp\/v2\/tags?post=2979"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}